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Journal Articles

Effect of radiation damage on luminescence of erbium-implanted SiO$$_{2}$$/Si studied by slow positron beam

Kawasuso, Atsuo; Arai, H.*; Hirata, K.*; Sekiguchi, T.*; Kobayashi, Yoshinori*; Okada, Sohei

Radiation Physics and Chemistry, 58(5-6), p.615 - 619, 2000/06

https://doi.org/10.1016/S0969-806X(00)00228-0
 Times Cited Count：3 Percentile：26.4(Chemistry, Physical)

no abstracts in English

Journal Articles

Application of synchrotron-radiation X-ray photoelectron spectroscopy and X-ray absorption near edge structure to the non-destructive depth analysis of SiO$$_{2}$$/Si layer

Yamamoto, Hiroyuki; Baba, Yuji

Photon Factory Activity Report 1998, P. 136, 1999/11

http://ccdb5fs.kek.jp/cgi-bin/img/tiff2gif?199923003+00166

no abstracts in English

Journal Articles

Resonant Auger electron spectroscopy for analysis of the chemical state of phosphorus segregated at SiO$$_{2}$$/Si Interfaces

Oshima, Masaharu*; *; Ono, Kanta*; Fujioka, Hiroshi*; *; Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi

Journal of Electron Spectroscopy and Related Phenomena, 88-91, p.603 - 607, 1998/00

https://doi.org/10.1016/S0368-2048(97)00169-2
 Times Cited Count：5 Percentile：25.63(Spectroscopy)

no abstracts in English

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